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Silicon Photonics Wafer Test System

Test & Measurement | Optics & Photonics | Silicon Photonics Wafer Test System | Optic

IFA-640-E is an automatic alignment system designed for Si-photonics wafer. The system consists of “Probe station module”, “Optical Alignment module”, and “Measurement module”.

Silicon Photonics Wafer Test System

Key Features

• Wafer level tester up to 12 inch wafer
• Automatic input / output coupling (wafer level vertical coupling)
• Coupling to fiber array blocks and / or optical fiber
• Convenient Graphic User Interface (GUI) with the capability of user programmable operation / measurement sequences
• Versatile alignment functions using image processing and contact sensor

Silicon Photonics Wafer Test System

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